| Date | HS Code | Product Description | Origin Country | Unit | Quantity | Total Value [USD] | Unit Price [USD] | Importer Name | Supplier Name |
|---|---|---|---|---|---|---|---|---|---|
| 02/Mar/2020 | 90129000 | Accessories of scanning electron microscope JSM-IT300LA- BEI probe, P / N: 782104282, manufacturer: Jeol / Japan, brand new 100% | Japan | piece/pcs | 1.00 | 4,477.76 | 4,477.76 | View Importer | View Supplier |
| 03/Jan/2019 | 90121000 | (used in teaching laboratory) Scanning electron microscope system paired with energy scattering probe (SEM) , model: JSM-IT 200 , manufacturer: Jeol / Japan , 100% new. Commodity details as attached file. | Japan | Set | 1.00 | 270,218.00 | 270,218.00 | View Importer | View Supplier |
